Published February 8, 2019 | Version v1
Journal article

Suppression of axial growth by boron incorporation in GaAs nanowires grown by self-catalyzed molecular beam epitaxy

  • 1. Center for Micro- and Nanostructures, Institute for Solid State Electronics, TU Wien, A-1040 Vienna (Austria)
  • 2. Center of Surface and Nanoanalytics, Johannes Kepler University Linz, A-4040 Linz (Austria)

Description

The addition of boron to GaAs nanowires grown by self-catalyzed molecular beam epitaxy was found to have a strong effect on the nanowire morphology, with axial growth greatly reduced as the nominal boron concentration was increased. Transmission electron microscopy measurements show that the Ga catalyst droplet was unintentionally consumed during growth. Concurrent radial growth, a rough surface morphology and tapering of nanowires grown under boron flux suggest that this droplet consumption is due to reduced Ga adatom diffusion on the nanowire sidewalls in the presence of boron. Modelling of the nanowire growth puts the diffusion length of Ga adatoms under boron flux at around 700–1000 nm. Analyses of the nanowire surfaces show regions of high boron concentration, indicating the surfactant nature of boron in GaAs. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6528/aaf11e

Additional details

Identifiers

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
30
Journal Issue
6
Journal Page Range
[9 p.]
ISSN
0957-4484