Published September 2019 | Version v1
Journal article

XUV diagnostic to monitor H-like emission from B, C, N, and O for the W7-X stellarator

  • 1. Inst Plasma Phys and Laser Microfus, Hery 23 St, PL-01497 Warsaw (Poland)
  • 2. Opole Univ, Inst Phys, Ul Oleska 48, PL-45052 Opole (Poland)
  • 3. Max Planck Inst Plasma Phys, Wendelsteinstr 1, D-17491 Greifswald (Germany)
  • 4. CEA, IRFM, F-13108 St Paul Les Durance (France)

Description

The 'C/O Monitor' system for the Wendelstein 7-X (W7-X) stellarator is a dedicated spectrometer with high throughput and high time resolution (order of 1 ms) for fast monitoring of content of low-Z impurities in the plasma. The observed spectral lines are fixed to Lyman-alpha lines of H-like atoms of carbon (3.4 nm), oxygen (1.9 nm), nitrogen (2.5 nm), and boron (4.9 nm). The quality of the wall condition will be monitored by the measurements of oxygen being released from the walls during the experiments. The strong presence of carbon is an indication for enhanced plasma-wall interaction or overload of plasma facing components. The presence of nitrogen (together with oxygen) may indicate a possible leakage in the vacuum system, whereas the intensity of the spectral emission of boron indicates the status of the boron layer evaporated onto the wall in order to reduce the influx of heavier steel ingredients or oxygen. The spectrometer will be fixed in a nearly horizontal position and is divided into two vacuum chambers, each containing two spectral channels assigned to two impurity species. Each channel will consist of a separate dispersive element and detector. The line-of-sight of both sub-spectrometers will cross at the main magnetic axis. This paper presents the conceptual design of the 'C/O Monitor' for W7-X which has already entered the executive stage. (authors)

Availability note (English)

Available from doi: http://dx.doi.org/10.1063/1.5099448

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
90
Journal Issue
no.9
Journal Page Range
p. 1-8
ISSN
0034-6748