A new endstation at the Swiss Light Source for ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy, and X-ray absorption spectroscopy measurements of liquid solutions
Creators
- 1. Institute for Chemical and Bioengineering, ETH Zürich, CH-8093 Zürich (Switzerland)
- 2. Laboratory of Physical Chemistry, ETH Zürich, CH-8093 Zürich (Switzerland)
- 3. Paul Scherrer Institute, CH-5232 Villigen PSI (Switzerland)
Description
A new liquid microjet endstation designed for ultraviolet (UPS) and X-ray (XPS) photoelectron, and partial electron yield X-ray absorption (XAS) spectroscopies at the Swiss Light Source is presented. The new endstation, which is based on a Scienta HiPP-2 R4000 electron spectrometer, is the first liquid microjet endstation capable of operating in vacuum and in ambient pressures up to the equilibrium vapor pressure of liquid water at room temperature. In addition, the Scienta HiPP-2 R4000 energy analyzer of this new endstation allows for XPS measurements up to 7000 eV electron kinetic energy that will enable electronic structure measurements of bulk solutions and buried interfaces from liquid microjet samples. The endstation is designed to operate at the soft X-ray SIM beamline and at the tender X-ray Phoenix beamline. The endstation can also be operated using a Scienta 5 K ultraviolet helium lamp for dedicated UPS measurements at the vapor-liquid interface using either He I or He II α lines. The design concept, first results from UPS, soft X-ray XPS, and partial electron yield XAS measurements, and an outlook to the potential of this endstation are presented
Additional details
Identifiers
- DOI
- 10.1063/1.4812786;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 84
- Journal Issue
- 7
- Journal Page Range
- p. 073904-073904.8
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45041514
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; DESIGN; ELECTRON SPECTROMETERS; ELECTRONS; LIQUIDS; SOFT X RADIATION; SOLUTIONS; SWISS LIGHT SOURCE; ULTRAVIOLET RADIATION; VAPOR PRESSURE; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; FLUIDS; HOMOGENEOUS MIXTURES; IONIZING RADIATIONS; LEPTONS; MEASURING INSTRUMENTS; MIXTURES; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SPECTROMETERS; SPECTROSCOPY; SYNCHROTRON RADIATION SOURCES; THERMODYNAMIC PROPERTIES; X RADIATION
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC