Published August 1989 | Version v1
Journal article Metadata-only

Quantitative elemental analysis of thick samples by XRF and PIXE

Creators

  • 1. Lisbon Univ. (Portugal). Centro de Fisica Nuclear

Description

An absolute quantitative analytical method without external standards has been developed for thick sample analysis by XRF and PIXE and has been applied to bronze and brass alloys. Comparisons between the results obtained and the chemical results were made and the detection limits for the determined elements were evaluated. In an Appendix a rapid calculation of the efficiency of the Ge(Hp) detector is presented. (author)

Additional details

Publishing Information

Journal Title
X-Ray Spectrometry, XRS
Journal Volume
18
Journal Issue
4
Series
X-Ray Spectrom., XRS.
Journal Page Range
157-164
ISSN
0049-8246
CODEN
XRSPA

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
21009483
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
BRASS; BRONZE; MULTI-ELEMENT ANALYSIS; PIXE ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
ALLOYS; CHEMICAL ANALYSIS; COPPER ALLOYS; COPPER BASE ALLOYS; NONDESTRUCTIVE ANALYSIS; TIN ALLOYS; X-RAY EMISSION ANALYSIS; ZINC ALLOYS