Published January 1990
| Version v1
Journal article
Structural analysis of an epitaxial layer of CdTe on GaAs by the multidirectional channeling technique
- 1. CSIRO Div. of Applied Physics, Lucas Heights Research Labs., Menai, NSW (Australia)
- 2. Telecom Australia Research Labs., Clayton, Victoria
- 3. CSIRO Div. of Materials Science and Tech., Clayton, Victoria (Australia)
Description
Multidirectional RBS channeling analysis is used to identify the crystal orientation of a MOCVD-grown CdTe layer on a (100) GaAs substrate. Results show that the CdTe has a (111) orientation. However, from channeling in different axial directions and a rotational angular scan around the <111> axis, it is deduced that the CdTe layer is multiply twinned about this axis. Cross-sectional electron microscopy has revealed the twins to be 180deg rotational twins. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section B
- Journal Volume
- 45
- Journal Issue
- 1-4
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. B.
- Journal Page Range
- 455-458
- ISSN
- 0168-583X
- CODEN
- NIMBE
Conference
- Title
- 9. international conference on ion beam analysis (IBA-9).
- Dates
- 26-30 Jun 1989.
- Place
- Kingston (Canada).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 21068892
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; BACKSCATTERING; CADMIUM TELLURIDES; EPITAXY; ION CHANNELING; ION IMPLANTATION; LAYERS; RUTHERFORD SCATTERING; SUBSTRATES; TWINNING
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CHANNELING; ELASTIC SCATTERING; HEAT TREATMENTS; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS