A description of the BNL active surface analysis facility

Berkeley Nuclear Laboratories has a responsibility for the assessment of radioactive specimens arising both from post irradiation examination of power reactor components and structures and experimental programmes concerned with fission and activation product transport. Existing analytical facilities have been extended with the commissioning of an active surface analysis instrument (XSAM 800pci, Kratos Analytical). Surface analysis involves the characterisation of the outer few atomic layers of a solid surface/interface whose chemical composition and electronic structure will probably be different from the bulk. The new instrument consists three interconnected chambers positioned in series; comprising of a high vacuum sample introduction chamber, an ultra-high vacuum sample treatment/fracture chamber and an ultra-high vacuum sample analysis chamber. The sample analysis chamber contains the electron, X-ray and ion-guns and the electron and ion detectors necessary for performing X-ray photoelectron spectroscopy, scanning Auger microscopy and secondary-ion mass spectroscopy. The chamber also contains a high stability manipulator to enable sub-micron imaging of specimens to be achieved and provide sample heating and cooling between - 180 and 6000C. (author)