Host-sensitized phosphorescence of Mn4+, Pr3+,4+ and Nd3+ in MgAl2Si2O8
- 1. Department of Materials Science and Engineering, Faculty of Engineering, Karamanoğlu Mehmetbey University, Karaman, 70200 (Turkey)
- 2. Department of Chemistry, Faculty of Science, Erciyes University, Kayseri 38039 (Turkey)
Description
Highlights: ► The new red phosphors were synthesized in the MgAl2Si2O8 system. ► These systems were characterized with DTA/TG, XRD, SEM and PL. ► The excitation and emission mechanisms were explained. -- Abstract: Mn4+ doped and Pr3+,4+, Nd3+ co-doped MgAl2Si2O8-based phosphors were first of all synthesized about 1300 °C. They were characterized by thermogravimetry (TG), differential thermal analysis (DTA), X-ray powder diffraction (XRD), photoluminescence (PL) and scanning electron microscopy (SEM). The luminescence mechanism of the phosphors, which showed broad red emission bands in the range of 610–715 nm and had a different maximum intensity when activated by UV illumination, was discussed. Such a red emission can be attributed to the intrinsic d–d transitions of Mn4+.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2012.02.009Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2012.02.009;
- PII
- S0025-5408(12)00063-3;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 47
- Journal Issue
- 5
- Journal Page Range
- p. 1138-1141
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45033464
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIFFERENTIAL THERMAL ANALYSIS; DOPED MATERIALS; MANGANESE IONS; NEODYMIUM IONS; PHOSPHORESCENCE; PHOSPHORS; PHOTOLUMINESCENCE; PRASEODYMIUM IONS; SCANNING ELECTRON MICROSCOPY; THERMAL GRAVIMETRIC ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; GRAVIMETRIC ANALYSIS; IONS; LUMINESCENCE; MATERIALS; MICROSCOPY; PHOTON EMISSION; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; THERMAL ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.