Rietveld refinement and dielectric studies of Bi0.8Ba0.2Fe0.95V0.05O3 ceramic
- 1. Department of Applied Physics, Guru Jambheshwar University of Science and Technology, Hisar-125001, Haryana (India)
Description
Polycrystalline Bi0.8Ba0.2Fe0.95V0.05O3 ceramic has been prepared by the conventional solid state reaction technique. The Rietveld refinement of x-ray powder diffraction revealed that the sample has a rhombohedral crystal structure (space group R3c) with average particle size of 29 nm. The values of dielectric constant (ε′) and dielectric loss (tan δ) increases with increasing temperature at different frequencies which may be the result of increase in the number of charge carriers and their mobilities due to the thermal activation. The Jonscher's universal power law used to analyze the ac conductivity. In the measured temperature range, the values of frequency exponent 's' are less than one and shows a continous decrease which is attributed to the short range translational hopping assisted by large polaron hopping mechanisms
Additional details
Identifiers
- DOI
- 10.1063/1.4873076;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1591
- Journal Issue
- 1
- Journal Page Range
- p. 1683-1685
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 58. DAE solid state physics symposium 2013
- Dates
- 17-21 Dec 2013
- Place
- Patiala, Punjab (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45090623
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERAMICS; CHARGE CARRIERS; DIELECTRIC MATERIALS; PARTICLE SIZE; PERMITTIVITY; POLYCRYSTALS; SOLIDS; SPACE GROUPS; TEMPERATURE RANGE; TRIGONAL LATTICES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES; SCATTERING; SIZE; SYMMETRY GROUPS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC