Published August 2008 | Version v1
Journal article

Aberration corrected tilt series restoration

  • 1. Oxford University, Department of Materials, Parks Road, Oxford, 0X1 3PH (United Kingdom)

Description

Aberration correction can be achieved using either direct electron optical correction or indirect image restoration. In the past focal series restoration has been applied to aberration corrected images in order to improve the quality of aberration correction and retrieve the complex specimen exit wavefunction. Image restoration can also be performed from a number of images with differing illumination tilts (a tilt series) instead of the more common focal series datasets where only the defocus value is varied. Here we apply tilt series image restoration to aberration corrected images and discuss the advantages of this approach. Preliminary results demonstrate the potential of this technique to provide interpretable structural information at resolutions beyond the axial information limit of the microscope.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/126/1/012042

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
126
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
Acronym
EMAG 2007
Dates
3-7 Sep 2007
Place
Glasgow, Scotland (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41036507
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CORRECTIONS; ELECTRON MICROSCOPY; ELECTRONS; ILLUMINANCE; IMAGES; RESOLUTION; WAVE FUNCTIONS
Descriptors DEC
ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; LEPTONS; MICROSCOPY