Aberration corrected tilt series restoration
Creators
- 1. Oxford University, Department of Materials, Parks Road, Oxford, 0X1 3PH (United Kingdom)
Description
Aberration correction can be achieved using either direct electron optical correction or indirect image restoration. In the past focal series restoration has been applied to aberration corrected images in order to improve the quality of aberration correction and retrieve the complex specimen exit wavefunction. Image restoration can also be performed from a number of images with differing illumination tilts (a tilt series) instead of the more common focal series datasets where only the defocus value is varied. Here we apply tilt series image restoration to aberration corrected images and discuss the advantages of this approach. Preliminary results demonstrate the potential of this technique to provide interpretable structural information at resolutions beyond the axial information limit of the microscope.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/126/1/012042Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 126
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
- Acronym
- EMAG 2007
- Dates
- 3-7 Sep 2007
- Place
- Glasgow, Scotland (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41036507
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CORRECTIONS; ELECTRON MICROSCOPY; ELECTRONS; ILLUMINANCE; IMAGES; RESOLUTION; WAVE FUNCTIONS
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; LEPTONS; MICROSCOPY