Analytical calculation of the I-V characteristics of SQUIDs with parasitic elements
Creators
- 1. Friedrich-Schiller-Universitaet Jena, Institut fuer Festkoerperphysik, Helmholtzweg 5, D-07743 Jena (Germany)
- 2. Siemens AG, Forschungszentrum Erlangen, D-91050 Erlangen (Germany)
Description
An approximate analytical calculation of the current-voltage characteristics of SQUIDs with parasitic capacitances and inductances is presented. The analytical treatment of the I-V curves is based on the approximation of harmonic signals. For bias currents IB>1.5 I0 (critical current of the SQUID) the approximated and the numerically calculated I-V curves are in very good agreement. From the analytical treatment of the characteristics we have derived analytical formulae for three voltages, where there is no flux modulation at the I-V characteristic. The comparison of numerically calculated and experimental characteristics shows that the equation of the upper point without flux modulation of the I-V curves is suitable for calculating parameters such as inductances and capacitances of SQUIDs with parasitic elements. (author)
Availability note (English)
Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/Additional details
Identifiers
- URL
- http://www.iop.org/;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 9
- Journal Issue
- 8
- Journal Page Range
- p. 617-621
- ISSN
- 0953-2048
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 32000790
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CAPACITANCE; CRITICAL CURRENT; INDUCTANCE; NUMERICAL SOLUTION; SQUID DEVICES; SUPERCONDUCTIVITY
- Descriptors DEC
- CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; SUPERCONDUCTING DEVICES