Published January 2016 | Version v1
Miscellaneous

A data aquisition system for abnormal RF waveform at SACLA

  • 1. Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Hyogo (Japan)
  • 2. RIKEN/SPring-8, Hyogo (Japan)

Description

At the X-ray Free Electron Laser (XFEL) facility, SACLA, we developed a data acquisition (DAQ) system to capture an abnormal radio frequency (RF) waveform for the diagnosis of suddenly occurring failures. The DAQ system consists of VME systems, a cache server, and a NoSQL database system, Apache Cassandra. When the VME system detects an abnormal RF waveform, it collects all the related waveforms of the same shot. The waveforms are stored in Cassandra through the cache server. Before the installation to SACLA, we ensured the performance with a prototype system. We installed the DAQ system into 34 LLRF VME systems at SACLA and six LLRF VME systems at a dedicated accelerator for the SACLA wide-band beam line. The DAQ system successfully acquired rare abnormal waveforms and contributed to the investigation of the failure analysis. (author)

Part of:
Proceedings of the 15th International Conference on Accelerator and Large Experimental Physics Control Systems ICALEPCS 2015

Additional details

Publishing Information

ISBN
978-3-95450-148-9
Imprint Title
Proceedings of the 15th International Conference on Accelerator and Large Experimental Physics Control Systems ICALEPCS 2015
Imprint Pagination
1225 p.
Journal Page Range
p. 721-724
Report number
INIS-AU--0089

Conference

Title
15. International Conference on Accelerator and Large Experimental Physics Control Systems
Acronym
ICALEPCS 2015
Dates
17-23 Oct 2015
Place
Melbourne, VIC (Australia)

INIS

Country of Publication
Australia
Country of Input or Organization
Australia
INIS RN
51100699
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTER CODES; DATA ACQUISITION SYSTEMS; DATA PROCESSING; FAILURES; FREE ELECTRON LASERS; MEMORY DEVICES; RF SYSTEMS; WAVE FORMS
Descriptors DEC
LASERS; PROCESSING

Optional Information

Notes
12 refs., 5 figs.