Published May 2014 | Version v1
Miscellaneous

The improvement of ion beam uniformity of 300mm bucket type ion source for in-line etching process

  • 1. Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of)

Description

To apply to in-line etching process of the steel industry, it is required high etching rate and over 1000 mm of extraction ion beam size. So we developed prototype bucket ion sources for the high rate etching and the increase in ion source life time for in-line type mass production. And we are developed the bucket type Ion source of 300mm ion beam width for large area etching. For large-area ion source, the control of the uniformity of the ion beam is very important. Detailed experimental results will be presented. We successfully extracted max 400mm ion beam width using the 300mm bucket type ion source. We are studied the optimum process condition for wide beam extraction and wide rage uniformity over 200mm. 90% uniformity, it was confirmed that it is a beam width of about 200mm by evaluating the uniformity test of the beam width 300mm Bucket type ion source. Further, via the power adjustment of the filament was significantly improved uniformity of large-area beam

Part of:
Proceedings of the KNS 2014 spring meeting

Additional details

Publishing Information

Publisher
KNS
Imprint Place
Daejeon (Korea, Republic of)
Imprint Title
Proceedings of the KNS 2014 spring meeting
Imprint Pagination
[1 CD-ROM]
Journal Page Range
[2 p.]

Conference

Title
2014 spring meeting of the KNS
Dates
28-30 May 2014
Place
Jeju (Korea, Republic of)

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
46050712
Subject category
S43: PARTICLE ACCELERATORS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ADHESION; ETCHING; EVALUATION; ION BEAMS; ION SOURCES
Descriptors DEC
BEAMS; SURFACE FINISHING

Optional Information

Notes
3 refs, 5 figs, 1 tab