Published February 15, 1978 | Version v1
Journal article

Polycrystalline film target texture and nuclear backscattering analysis

  • 1. Aarhus Univ. (Denmark). Inst. of Physics
  • 2. IBM Watson Research Center, Yorktown Heights, N.Y. (USA)

Description

The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaporated thin-film targets of Nb, Ag, Au, and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils. (Auth.)

Additional details

Identifiers

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
149
Journal Issue
1-3
Series
Nucl. Instrum. Methods.
Journal Page Range
247-251
ISSN
0029-554X

Conference

Title
3. international conference on ion beam analysis.
Dates
27 Jun - 1 Jul 1977.
Place
Washington, D.C., USA.

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent