Published August 15, 1981
| Version v1
Journal article
Experience with a Compton-suppressed spectrometer (heavy ion, xn) reactions
Creators
- 1. Australian National Univ., Canberra. Research School of Physical Sciences
Description
A Compton-suppressed spectrometer consisting of a Ge(Li) detector and a NaI(T1) shield, in the asymmetrical arrangment, has been used for both singles and coincidence γ-ray measurements in (16O,xn) reactions leading to deformed nuclei in the osmium region. The rejection of peak events because of true coincidences between γ-ray or neutron events in the NaI(T1) shield, and the Ge(Li) detector, has been measured for typical cases. The contributions to this peak rejection, and their sensitivity to multiplicity are discussed. (orig.)
Additional details
Additional titles
- Subtitle (English)
- Peak rejection in singles and coincidence measurements
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 187
- Journal Issue
- 2/3
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 413-421
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 13651120
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- COINCIDENCE SPECTROMETRY; DEFORMED NUCLEI; ERBIUM 166 TARGET; EXPERIMENTAL DATA; GAMMA SPECTRA; GAMMA SPECTROMETERS; HEAVY ION FUSION REACTIONS; LI-DRIFTED GE DETECTORS; MEV RANGE 10-100; NAI DETECTORS; NEUTRONS; OSMIUM 178; OXYGEN 16 REACTIONS; SENSITIVITY
- Descriptors DEC
- BARYONS; COINCIDENCE METHODS; COUNTING TECHNIQUES; DATA; ELEMENTARY PARTICLES; ENERGY RANGE; EVEN-EVEN NUCLEI; FERMIONS; GE SEMICONDUCTOR DETECTORS; HADRONS; HEAVY ION REACTIONS; INFORMATION; INTERMEDIATE MASS NUCLEI; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEAR REACTIONS; NUCLEI; NUCLEONS; NUCLEOSYNTHESIS; NUMERICAL DATA; OSMIUM ISOTOPES; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS; SPECTRA; SPECTROMETERS; TARGETS