Phase transformations of an alumina membrane and its influence on silicon nucleation during the aluminium induced layer exchange
- 1. University Servicecenter for TEM, Technische Universitaet Wien, Wiedner Hauptstrasse 8-10, A-1040 Vienna (Austria)
- 2. Institute for Solid State Physics, Technische Universitaet Wien, Wiedner Hauptstrasse 8-10, A-1040 Vienna (Austria)
- 3. Hahn-Meitner-Institut Berlin, Abt. Si-Photovoltaik, Kekulestrasse 5, D-12489 Berlin (Germany)
Description
The aluminium induced layer exchange process is used for growing crystalline Si films on amorphous substrates like glass, which are further epitaxially thickened and can be used for photovoltaic applications. In this work we investigated Al2O3 membranes separating the Al and Si layer during the layer exchange by means of high-resolution transmission electron microscopy and studied the influence of the membranes' structure on crystallization of Si. We observed a phase transformation of the membrane from the amorphous state to γ-Al2O3 at exchange temperatures at above 450 deg. C. At higher temperatures this transformations induces cracks into the thin membrane. We further discuss the influence of this phase transformation on the preferential orientation of the growing Si grains
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.09.038;
- PII
- S0040-6090(06)01089-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 7-8
- Journal Page Range
- p. 3740-3744
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39021138
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM OXIDES; AMORPHOUS STATE; CRACKS; CRYSTALLIZATION; EPITAXY; FILMS; LAYERS; PHOTOVOLTAIC EFFECT; SILICON; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL GROWTH METHODS; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTOELECTRIC EFFECT; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.