Published 1997
| Version v1
Book
TEM investigation of the structural modifications in silicon irradiated successively by the ions N+ and Ne+ or Ar8 and He+ with the help of the cross-section method
Description
no abstract available
Additional details
Publishing Information
- Publisher
- JINR
- Imprint Place
- Dubna (Russian Federation)
- ISBN
- 5-85165-475-9
- Imprint Title
- Heavy ion physics. Abstracts
- Imprint Pagination
- 278 p.
- Journal Page Range
- p. 257
Conference
- Title
- 6. International school-seminar on heavy ion physics; International workshop on applied nuclear physics research
- Dates
- 22-27 Sep 1997
- Place
- Dubna (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 30055690
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- AMORPHOUS STATE; ARGON IONS; CRYSTAL DEFECTS; CRYSTALS; HELIUM IONS; INTERFACES; ION BEAMS; NITROGEN ISOTOPES; PHASE TRANSFORMATIONS; PHYSICAL RADIATION EFFECTS; SILICON; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; IONS; ISOTOPES; MICROSCOPY; RADIATION EFFECTS; SEMIMETALS