Published September 2017 | Version v1
Journal article

Architecture and characterization of the P4DI CMOS hybrid pixel sensor

  • 1. Oy Ajat Ltd, Tekniikantie 4 B, Fin—02150 Espoo (Finland)
  • 2. ADVEOS Microelectronic Systems P.C., 5 Ymittou str., Cholargos—Attiki, 15561 (Greece)
  • 3. Institute of Nuclear Physics, National Center for Scientific Research Demokritos, Patriarchou Grigoriou and Neapoleos, Agia Paraskevi—Attiki, 15310 (Greece)
  • 4. European Sensor Systems, 7 Stratigi str., Neo Psychico—Attiki, 15451 (Greece)
  • 5. Technological Educational Institute of Sterea Ellada, Psahna—Evia, 34400 (Greece)

Description

Gamma ray imaging can be used for the extraction either of the activity map of a source or of the attenuation map of an object or both, as well as for the identification of the material composition of the emitting source or the object. All these imaging modalities can benefit from instruments giving the information of the energy of the converted photons and also the spatial and time coordinates of the conversion. The P4DI CMOS and hybrid provides the core technology for this task being a 2-D array based on Cd(Zn)Te material for the sensing layer. It consists of 1250 pixels with 400 μ m pitch. The energy resolution of the 241Am photopeak is 3.5 keV, time resolution is less than 12 μ s and power consumption is less than 100 mW. Architecture and characterization are described.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/12/09/P09031

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
12
Journal Issue
09
Journal Page Range
p. P09031
ISSN
1748-0221