Published June 1996
| Version v1
Journal article
An experimental survey of heavy ion induced dielectric rupture in Actel field programmable gate arrays (FPGAs)
Creators
- 1. California Inst. of Tech., Pasadena, CA (United States). Jet Propulsion Lab.
- 2. NASA, Greenbelt, MD (United States). Goddard Space Flight Center
Description
Irradiations an subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 43
- Journal Issue
- 3Pt1
- Journal Page Range
- p. 967-972.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- 3. European symposium on radiations and their effects on components and systems.
- Dates
- 18-22 Sep 1995.
- Place
- Arcachon (France).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27075942
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- EXPERIMENTAL DATA; INTEGRATED CIRCUITS; PHYSICAL RADIATION EFFECTS; SPACE DEPENDENCE; SPACE FLIGHT; SYSTEM FAILURE ANALYSIS; TEMPERATURE DEPENDENCE
- Descriptors DEC
- DATA; ELECTRONIC CIRCUITS; INFORMATION; NUMERICAL DATA; RADIATION EFFECTS; SYSTEMS ANALYSIS
Optional Information
- Secondary number(s)
- CONF-9509107--.