Proton Induced X-ray Emission Analysis of Sources of Raw for Blue-and-White Porcelain From Jingdezhen and Dehua Area
Creators
- 1. College of Education, Nanyang University of Technology, Nanyang (China)
- 2. Henan Radio and Television University, Zhengzhou (China)
- 3. Department of Physics, Beijign Normal University, Beijing (China)
- 4. Physical Engineering Collgeg, Zhengzhou University, Zhengzhou (China)
- 5. Institute of Modern Physics, Fudan University, Shanghai (China)
- 6. Dehua Country Ceramics Museum, Dehua (China)
Description
In order to find out sources of raw, ingredients and classification relationship for Blue-and-White porcelain from Jingdezhen and Dehua area in different time, 34 Blue-and-White porcelain samples were selected. The chemical ingredients of every sample were determined by proton induced X-ray emission. The chemical ingredients data of all samples were further analyzed using fuzzy cluster analysis. The results indicate that the sources of raw and classification relationship of majority bodies from Blue-and-White porcelain of Dehua and Jingdezhen area are commendably differentiated. The sources of raw and batch formulas of eight transparent enamel samples from Jingdezhen area in Ming Dynasty and majority transparent enamel samples from Dehua area are commendably differentiated. Except one or two samples, majority Blue-and-White glaze samples from two areas are obviously different, and it might be an important path for non-destructive discrimination among Blue-and-White porcelains from two areas. (authors)
Additional details
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 44
- Journal Issue
- 2
- Journal Page Range
- p. 252-256
- ISSN
- 1000-6931
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 43084987
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ARCHAEOLOGICAL SITES; ARCHAEOLOGICAL SPECIMENS; CHINA; ENAMELS; GLAZES; PIXE ANALYSIS; PORCELAIN; RAW MATERIALS
- Descriptors DEC
- ASIA; CHEMICAL ANALYSIS; COATINGS; MATERIALS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 3 figs., 1 tabs., 6 refs.