Published October 2019 | Version v1
Journal article

Bending of nanoporous thin films under ion radiation

  • 1. Department of Applied Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, the (Netherlands)
  • 2. National Science Center "Kharkiv Institute of Physics and Technology", Akademichna St. 1, 61108 Kharkiv (Ukraine)

Description

Highlights: • Radiation-induced coarsening/sintering leads to negative swelling. • Inhomogeneous radiation-induced coarsening of nanoporous structure results in bending. • Nanoporous materials are unsuitable for coatings in nuclear applications. -- Abstract: In general, fundamental understanding of radiation resistance of high surface density nanoporous materials and nanoporous coatings is severely lacking. In this contribution ion-induced bending phenomena are studied in free-standing nanoporous Au cantilevers with thickness in the range of 100 to 200 nm. Experiments were performed in a Tescan Lyra dual beam system with Ga+ ion irradiation normal to the sample surface up to a maximum fluence of ~3 × 1019 m−2. Cantilevers bend towards the incident ion beam. It was found that the sensitivity of nanoporous Au samples to radiation-induced bending is substantially higher in comparison to the solid bulk counterparts. The process is described in terms of ion-induced coarsening of the structure top layers, which generates a volume contraction responsible for the bending moment. Therefore it is concluded that radiation-induced coarsening/sintering leads to negative swelling. Radiation-modified effective Young's modulus of the top layers was shown to influence essentially the fluence dependence of bending curvature. Model predictions agree well with our experimental findings showing that inhomogeneous radiation-induced coarsening of nanoporous structure results in bending and that nanoporous materials are less suitable for coatings in nuclear applications under the test conditions.

Additional details

Identifiers

DOI
10.1016/j.tsf.2019.137419;
PII
S0040609019304389;

Publishing Information

Journal Title
Thin Solid Films (Print)
Journal Volume
688
Journal Page Range
vp.
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Switzerland
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55041443
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COATINGS; GALLIUM IONS; ION BEAMS; IRRADIATION; LAYERS; NANOSTRUCTURES; RADIATION EFFECTS; SENSITIVITY; SULFUR IONS; SURFACES; THICKNESS; THIN FILMS
Descriptors DEC
BEAMS; CHARGED PARTICLES; DIMENSIONS; FILMS; IONS

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.