Published November 1985
| Version v1
Journal article
Recent advances in high resolution scanning transmission electron microscopy
Creators
- 1. VG Scientific Ltd, The Birches Industrial Estate, East Grinstead (UK)
- 2. VG Instruments, 78 - Le Chesnay (France)
Description
The HB501 field emission source STEM has established itself in recent years as a powerful microanalytical tool capable of chemical and structural analysis at the nanometer level. The attraction of this approach lies in the ability of Auger Spectroscopy to provide surface sensitive information and the potentially high spatial resolution of the technique when thin, transmission-type specimens are used
Additional details
Publishing Information
- Journal Title
- J. Microsc. Spectrosc. Electron.
- Journal Volume
- 10
- Journal Issue
- 5
- Series
- J. Microsc. Spectrosc. Electron.
- Journal Page Range
- 377-379
- ISSN
- 0395-9279
- CODEN
- JMSED
Conference
- Title
- Annual meeting of the SFME.
- Dates
- 28-31 May 1985.
- Place
- Strasbourg (France).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 17037606
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; ELECTRON MICROSCOPES; FIELD EMISSION; MODIFICATIONS; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; EMISSION; MICROSCOPES; MICROSCOPY; RESOLUTION; SPECTROSCOPY