Three-dimensional transient temperature field model for laser annealing
- 1. Department of Engineering Physics, Ecole Polytechnique de Montreal, Laser Processing Laboratory, C.P. 6079, succ. Centre-ville, Montreal, Quebec H3C 3A7 (Canada)
Description
A three-dimensional transient temperature field model (TTFM) is proposed for the general problem of laser-induced out-of-equilibrium annealing of a bilayer device, which is made up of a bulk material covered by a transparent layer. The TTFM solves the moving-boundary problem with a deterministic relation between the interface velocity and temperature in contrast to preceding problem-dependent models, which use an interface-tracking heuristic algorithm. The TTFM is the first step to model many temperature-driven phenomena such as diffusion and segregation in laser annealing. Both computed transient temperature field and melted-zone dimensions of a SiO2/Si example device, which is irradiated by a focused visible (532 nm) laser, are in very good agreement with experimental measurements
Additional details
Identifiers
- DOI
- 10.1063/1.1846943;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 97
- Journal Issue
- 3
- Journal Page Range
- p. 033520-033520.6
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36102993
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALGORITHMS; ANNEALING; BOUNDARY-VALUE PROBLEMS; CRYSTAL MODELS; DIFFUSION; INTERFACES; IRRADIATION; LASERS; LAYERS; MELTING; SEGREGATION; SILICON; SILICON OXIDES; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CHALCOGENIDES; ELEMENTS; HEAT TREATMENTS; MATHEMATICAL LOGIC; MATHEMATICAL MODELS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Notes
- (c) 2005 American Institute of Physics