Published February 1, 2005 | Version v1
Journal article

Three-dimensional transient temperature field model for laser annealing

  • 1. Department of Engineering Physics, Ecole Polytechnique de Montreal, Laser Processing Laboratory, C.P. 6079, succ. Centre-ville, Montreal, Quebec H3C 3A7 (Canada)

Description

A three-dimensional transient temperature field model (TTFM) is proposed for the general problem of laser-induced out-of-equilibrium annealing of a bilayer device, which is made up of a bulk material covered by a transparent layer. The TTFM solves the moving-boundary problem with a deterministic relation between the interface velocity and temperature in contrast to preceding problem-dependent models, which use an interface-tracking heuristic algorithm. The TTFM is the first step to model many temperature-driven phenomena such as diffusion and segregation in laser annealing. Both computed transient temperature field and melted-zone dimensions of a SiO2/Si example device, which is irradiated by a focused visible (532 nm) laser, are in very good agreement with experimental measurements

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
97
Journal Issue
3
Journal Page Range
p. 033520-033520.6
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2005 American Institute of Physics