Published October 1982
| Version v1
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Theory of pulsed-irradiation microstructures
Description
Flux pulsing is predicted to influence microstructures because of pulse annealing and on point defect annealing. Specifically void annealing and vacancy annealing are analyzed. A high dislocation density enhances the void annealing effect but inhibits the point defect annealing effect. Furthermore, pulsing effects are greater for higher damage rates and smaller defect aggregates. It is concluded that pulsed ion irradiations can simulate pulsed fusion irradiations if it is recognized that the ions exaggerate the expected neutron effect
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE83006200.
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Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- PNL--10331
Conference
- Title
- TMS/AIME fall meeting.
- Dates
- 24 - 28 Oct 1982.
- Place
- St Louis, MO (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14765805
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; DEFECTS; ION BEAMS; IRRADIATION; MICROSTRUCTURE; NEUTRON REACTIONS; SWELLING; THERMONUCLEAR REACTOR MATERIAL; VOIDS
- Descriptors DEC
- BARYON REACTIONS; BEAMS; CRYSTAL STRUCTURE; DEFORMATION; HADRON REACTIONS; HEAT TREATMENTS; MATERIALS; NUCLEAR REACTIONS; NUCLEON REACTIONS
Optional Information
- Secondary number(s)
- CONF-821049--12.