Published October 1982 | Version v1
Report Restricted

Theory of pulsed-irradiation microstructures

Description

Flux pulsing is predicted to influence microstructures because of pulse annealing and on point defect annealing. Specifically void annealing and vacancy annealing are analyzed. A high dislocation density enhances the void annealing effect but inhibits the point defect annealing effect. Furthermore, pulsing effects are greater for higher damage rates and smaller defect aggregates. It is concluded that pulsed ion irradiations can simulate pulsed fusion irradiations if it is recognized that the ions exaggerate the expected neutron effect

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE83006200.

Files

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Additional details

Publishing Information

Imprint Pagination
19 p.
Report number
PNL--10331

Conference

Title
TMS/AIME fall meeting.
Dates
24 - 28 Oct 1982.
Place
St Louis, MO (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
14765805
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; DEFECTS; ION BEAMS; IRRADIATION; MICROSTRUCTURE; NEUTRON REACTIONS; SWELLING; THERMONUCLEAR REACTOR MATERIAL; VOIDS
Descriptors DEC
BARYON REACTIONS; BEAMS; CRYSTAL STRUCTURE; DEFORMATION; HADRON REACTIONS; HEAT TREATMENTS; MATERIALS; NUCLEAR REACTIONS; NUCLEON REACTIONS

Optional Information

Secondary number(s)
CONF-821049--12.