2-Point correlation function of nanostructured materials via the grey-tone correlation function of electron tomograms: A three-dimensional structural analysis of ordered mesoporous silica
- 1. University of Liege, Department of Chemical Engineering, Allee du 6 aout 3, 4000 Liege (Belgium)
- 2. Utrecht University, Debye Institute for Nanomaterials Science, Inorganic Chemistry and Catalysis, Sorbonnelaan 16, 3584 Utrecht (Netherlands)
Description
Electron tomography is a unique technique for imaging the microstructure of materials with a nanometer resolution. The signal-to-noise ratio of electron tomograms is, however, often too low for a reliable segmentation-based image analysis. We derive a general relation between the grey-tone correlation function of the tomograms and the 2-point correlation function of the morphology, which enables us to analyse quantitatively the grey-tone correlation function with a morphological model of the material. The methodology is applied to SBA-15 ordered mesoporous silica. The three-dimensional grey-tone correlation function obtained from electron tomography is analysed in terms of a hexagonal array of Gaussian independent pores. The model enables us to relate the morphology obtained from the 2-point correlation function to macroscopic characterization data of the material, notably small-angle X-ray scattering and nitrogen adsorption.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2009.09.055Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2009.09.055;
- PII
- S1359-6454(09)00661-2;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 58
- Journal Issue
- 3
- Journal Page Range
- p. 770-780
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43039120
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADSORPTION; CORRELATION FUNCTIONS; CORRELATIONS; ELECTRONS; IMAGE PROCESSING; MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURES; NITROGEN; POROUS MATERIALS; RESOLUTION; SIGNAL-TO-NOISE RATIO; SILICA; SMALL ANGLE SCATTERING; THREE-DIMENSIONAL CALCULATIONS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FUNCTIONS; LEPTONS; MATERIALS; MICROSCOPY; MINERALS; NONMETALS; OXIDE MINERALS; PROCESSING; SCATTERING; SORPTION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.