Published May 1997 | Version v1
Journal article

High resolution monochromatic X-ray imaging system based on spherically bent crystals

  • 1. Science Applications International Corp., McLean, Virginia22102 (United States)
  • 2. Naval Research Laboratory, Washington, District of Columbia20375 (United States)
  • 3. SFA Inc., 1401 McCormic Drive, Landover, Maryland20785 (United States)

Description

We have developed a new X-ray imaging system based on spherically curved crystals. It is designed and used for diagnostics of targets ablatively accelerated by the Nike KrF laser [1,2]. The imaging system is used for plasma diagnostics of the main target and for characterization of potential backlighters. A spherically curved quartz crystal (2d=6.687 Angstrom, R=200mm) is used to produce monochromatic backlit images with the He-like Si resonance line (1865 eV) as the source of radiation. The spatial resolution of the X-ray optical system is 3 endash 4 μm. Time resolved backlit monochromatic images of CH planar targets driven by the Nike facility have been obtained with 6 endash 7 μm spatial resolution. copyright 1997 American Institute of Physics

Additional details

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
409
Journal Issue
1
Journal Page Range
p. 437-442
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
4. international conference on dense Z-pinches
Dates
28-31 May 1997
Place
Vancouver (Canada)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
29047767
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
IMAGES; LASER-PRODUCED PLASMA; PLASMA DIAGNOSTICS; SPATIAL RESOLUTION; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; PLASMA; RADIATIONS; RESOLUTION

Optional Information

Secondary number(s)
CONF-9705120--