Published May 1, 2018 | Version v1
Journal article

Anti-Reflection Characteristics of Si Nanowires for Enhanced Photoluminescence from CdTe/CdS Quantum Dots

  • 1. Tongda College, Nanjing University of Posts and Telecommunications, Nanjing 210003 (China)
  • 2. National Laboratory of Solid State Microstructure and School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)

Description

CdTe/CdS quantum dots (QDs) are fabricated on Si nanowires (NWs) substrates with and without Au nanoparticles (NPs). The formation of Au NPs on Si NWs can be certified as shown in scanning electron microscopy images. The optical properties of samples are also investigated. It is interesting to find that the photoluminescence (PL) intensity of CdTe/CdS QD films on Si nanowire substrates with Au NPs is significantly increased, which can reach 8-fold higher than that of samples on planar Si without Au NPs. The results of finite-difference time-domain simulation indicate that Au NPs induce stronger localization of electric field and then boost the PL intensity of QDs nearby. Furthermore, the time-resolved luminescence decay curve shows the PL lifetime, which is about 5.5 ns at the emission peaks of QD films on planar, increasing from 1.8 ns of QD films on Si NWs to 4.7 ns after introducing Au NPs into Si NWs. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0256-307X/35/5/056801

Additional details

Publishing Information

Journal Title
Chinese Physics Letters
Journal Volume
35
Journal Issue
5
Journal Page Range
[4 p.]
ISSN
0256-307X
CODEN
CPLEEU