Published 1982 | Version v1
Journal article Metadata-only

Equivalence between profile refinement and integrated intensity refinement

Creators

  • 1. New South Wales Institute of Technology, Kensington, Australia

Description

It is shown that the results of least squares refinement for crystallographic parameters are identical when the ordinates of the profile are refined or when integrated intensities are extracted as an intermediate step

Additional details

Publishing Information

Journal Title
AIP Conf. Proc.
Journal Issue
no.89
Series
AIP Conf. Proc.
ISSN
0094-243X
CODEN
APCPC

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17028616
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DATA PROCESSING; LATTICE PARAMETERS; LEAST SQUARE FIT; NEUTRON DIFFRACTION; NEUTRON SPECTRA
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MAXIMUM-LIKELIHOOD FIT; NUMERICAL SOLUTION; SCATTERING; SPECTRA