Published June 15, 2008
| Version v1
Journal article
Investigation on structural and thermal expansion properties of Al2ErGe2
- 1. School of Science, Wuhan Institute of Technology, Wuhan, Hubei 430073 (China)
- 2. Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education Guangxi University, Nanning, Guangxi 530004 (China)
- 3. College of Electronic and Communication Engineering, Guangxi University for Nationalities, Nanning 530006 (China)
Description
The crystal structure of the compound Al2ErGe2 has been determined by X-ray powder diffraction technique and refined by using Rietveld method. The compound Al2ErGe2 crystallizes in a hexagonal Al2CaSi2-type structure (space group P3-barm1, a = 0.41781(9) nm, c = 0.66698(1) nm, z = 1). Lattice thermal expansion studies on the compound were carried out in the temperature range from 298 to 913 K. The variation of the unit cell parameters shows that the lattice parameters increase with the increase in temperature. The coefficients of average relative thermal expansion of the compound along various axes were presented
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2008.01.001Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2008.01.001;
- PII
- S0254-0584(08)00004-7;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 109
- Journal Issue
- 2-3
- Journal Page Range
- p. 515-518
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40019672
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; CRYSTAL STRUCTURE; ERBIUM ALLOYS; GERMANIUM ALLOYS; LATTICE PARAMETERS; SPACE GROUPS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THERMAL EXPANSION; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; EXPANSION; RARE EARTH ALLOYS; SCATTERING; SYMMETRY GROUPS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.