Atomic structure at the electrochemical interface

X-ray diffraction has become a powerful in situ probe of the atomic structure at the metal/electrolyte interface. Potentiodynamic measurements are discussed in which the x-ray intensity at a selected reciprocal lattice point is monitored as the applied electrode potential is cycled. This technique is termed 'x-ray voltammetry' in direct analogy to the electrochemical technique of cyclic voltammetry. The application of the technique is highlighted by examples of surface reconstruction, metal growth and the adsorption and oxidation of carbon monoxide. (author)