Low power analog readout front-end electronics for time and energy measurements
Creators
Description
We report on the design and measurements of an analog front-end readout electronics dedicated for silicon microstrip detectors with relatively large capacitance of the order of tens pF for time and energy measurements of incoming pulses. The front-end readout electronics is required to process input pulses with an average rate of 150 kHz/channel with low both power consumption and noise at the same time. In the presented solution the single channel is built of two different parallel processing paths: fast and slow. The fast path includes the fast CR–RC shaper with the peaking time tp=40 ns and is optimized to determine the input charge arrival time. The slow path, which consists of the slow CR–(RC)2 shaper with the peaking time tp=80 ns, is dedicated for low noise accurate energy measurement. The analog front-end electronics was implemented in UMC 180 nm CMOS technology as a prototype ASIC AFE. The AFE chip contains 8 channels with the size of 58 μm×1150 μm each. It has low power dissipation Pdiss=3.1 mW per single channel. The article presents the details of the front-end architecture and the measurement results
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2014.02.018Additional details
Identifiers
- DOI
- 10.1016/j.nima.2014.02.018;
- PII
- S0168-9002(14)00174-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 748
- Journal Page Range
- p. 54-60
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46019777
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DESIGN; PARALLEL PROCESSING; PULSES; READOUT SYSTEMS; SI MICROSTRIP DETECTORS
- Descriptors DEC
- MEASURING INSTRUMENTS; PROGRAMMING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.