Published June 1, 2014 | Version v1
Journal article

Low power analog readout front-end electronics for time and energy measurements

Description

We report on the design and measurements of an analog front-end readout electronics dedicated for silicon microstrip detectors with relatively large capacitance of the order of tens pF for time and energy measurements of incoming pulses. The front-end readout electronics is required to process input pulses with an average rate of 150 kHz/channel with low both power consumption and noise at the same time. In the presented solution the single channel is built of two different parallel processing paths: fast and slow. The fast path includes the fast CR–RC shaper with the peaking time tp=40 ns and is optimized to determine the input charge arrival time. The slow path, which consists of the slow CR–(RC)2 shaper with the peaking time tp=80 ns, is dedicated for low noise accurate energy measurement. The analog front-end electronics was implemented in UMC 180 nm CMOS technology as a prototype ASIC AFE. The AFE chip contains 8 channels with the size of 58 μm×1150 μm each. It has low power dissipation Pdiss=3.1 mW per single channel. The article presents the details of the front-end architecture and the measurement results

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2014.02.018

Additional details

Identifiers

DOI
10.1016/j.nima.2014.02.018;
PII
S0168-9002(14)00174-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
748
Journal Page Range
p. 54-60
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46019777
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DESIGN; PARALLEL PROCESSING; PULSES; READOUT SYSTEMS; SI MICROSTRIP DETECTORS
Descriptors DEC
MEASURING INSTRUMENTS; PROGRAMMING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.