Published December 1, 2008 | Version v1
Journal article

Site-specific forest-assembly of single-wall carbon nanotubes on electron-beam patterned SiOx/Si substrates

  • 1. Materials Science and Engineering Program, Department of Chemical, Materials and Biomolecular Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT 06269 (United States)
  • 2. Nanomaterials Optoelectronics Laboratory, Polymer Program, Institute of Materials Science, Department of Chemistry, University of Connecticut, Storrs, CT 06269 (United States)

Description

Based on electron-beam direct writing on the SiOx/Si substrates, favorable absorption sites for ferric cations (Fe3+ ions) were created on the surface oxide layer. This allowed Fe3+-assisted self-assembled arrays of single-wall carbon nanotube (SWNT) probes to be produced. Auger investigation indicated that the incident energetic electrons depleted oxygen, creating more dangling bonds around Si atoms at the surface of the SiOx layer. This resulted in a distinct difference in the friction forces from unexposed regions as measured by lateral force microscopy (LFM). Atomic force microscopy (AFM) affirmed that the irradiated domains absorbed considerably more Fe3+ ions upon immersion into pH 2.2 aqueous FeCl3 solution. This rendered a greater yield of FeO(OH)/FeOCl precipitates, primarily FeO(OH), upon subsequent washing with lightly basic dimethylformamide (DMF) solution. Such selective metal-functionalization established the basis for the subsequent patterned forest-assembly of SWNTs as demonstrated by resonance Raman spectroscopy

Availability note (English)

Available from http://dx.doi.org/10.1016/j.msec.2008.03.002

Additional details

Identifiers

DOI
10.1016/j.msec.2008.03.002;
arXiv
arXiv:1105.1598v1;
PII
S0928-4931(08)00054-4;

Publishing Information

Journal Title
Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
Journal Volume
28
Journal Issue
8
Journal Page Range
p. 1366-1371
ISSN
0928-4931

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.