Published August 11, 2000
| Version v1
Journal article
Drift velocity monitoring of SDDs using MOS charge injectors
Description
We report results of drift velocity monitoring in silicon drift detectors, obtained in beam test conditions using MOS charge injectors. We are able to correct velocity variations as small as 0.1% due to temperature variations of the order of 0.1 K and consequently maintain an optimal space resolution
Additional details
Identifiers
- PII
- S0168900200002783;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 450
- Journal Issue
- 2-3
- Journal Page Range
- p. 338-342
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34041040
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DRIFT CHAMBERS; INJECTION; POSITRON DETECTION; SEMICONDUCTOR DEVICES; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION; VELOCITY
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; INTAKE; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBERS; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.