The impact of plasma dynamics on the self-magnetic-pinch diode impedance
Creators
- Bennett, Nichelle1
- Crain, M. Dale1
- Droemer, Darryl W.1
- Gignac, Raymond E.1
- Molina, Isidro1
- Obregon, Robert1
- Smith, Chase C.1
- Wilkins, Frank L.1
- Welch, Dale R.2
- Webb, Timothy J.3
- Mazarakis, Michael G.3
- Kiefer, Mark L.3
- Johnston, Mark D.3
- Leckbee, Joshua J.3
- Nielsen, Dan3
- Romero, Tobias3
- Simpson, Sean3
- Ziska, Derek3
- 1. National Security Technologies, LLC, Las Vegas, Nevada 89193 (United States)
- 2. Voss Scientific, LLC, Albuquerque, New Mexico 87108 (United States)
- 3. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
Description
The self-magnetic-pinch diode is being developed as an intense electron beam source for pulsed-power-driven x-ray radiography. The basic operation of this diode has long been understood in the context of pinched diodes, including the dynamic effect that the diode impedance decreases during the pulse due to electrode plasma formation and expansion. Experiments being conducted at Sandia National Laboratories' RITS-6 accelerator are helping to characterize these plasmas using time-resolved and time-integrated camera systems in the x-ray and visible. These diagnostics are analyzed in conjunction with particle-in-cell simulations of anode plasma formation and evolution. The results confirm the long-standing theory of critical-current operation with the addition of a time-dependent anode-cathode gap length. The results may suggest that anomalous impedance collapse is driven by increased plasma radial drift, leading to larger-than-average ion vr × Bθ acceleration into the gap
Additional details
Identifiers
- DOI
- 10.1063/1.4916062;
Publishing Information
- Journal Title
- Physics of Plasmas
- Journal Volume
- 22
- Journal Issue
- 3
- Journal Page Range
- p. 033113-033113.10
- ISSN
- 1070-664X
- CODEN
- PHPAEN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46114103
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ACCELERATORS; ANODES; CAMERAS; CATHODES; COMPUTERIZED SIMULATION; CRITICAL CURRENT; ELECTRON BEAMS; PINCH DEVICES; PLASMA; PLASMA EXPANSION; PULSES; SANDIA NATIONAL LABORATORIES; TIME DEPENDENCE; TIME RESOLUTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- BEAMS; CURRENTS; ELECTRIC CURRENTS; ELECTRODES; EXPANSION; INDUSTRIAL RADIOGRAPHY; LEPTON BEAMS; MATERIALS TESTING; NATIONAL ORGANIZATIONS; NONDESTRUCTIVE TESTING; PARTICLE BEAMS; RESOLUTION; SIMULATION; TESTING; THERMONUCLEAR DEVICES; TIMING PROPERTIES; US DOE; US ORGANIZATIONS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC