Published 1979 | Version v1
Journal article Metadata-only

Electronic structure of Sm surface studied by synchrotron-radiation-excited-photoelectron spectroscopies

Creators

  • 1. Xerox Palo Alto Research Center, CA (USA)
  • 2. Stanford Univ., CA (USA). Stanford Synchrotron Radiation Lab.

Description

We have utilized synchrotron radiation in the 50-250 eV range to make surface sensitive photoelectron measurements on Sm. For 150 eV photons the valence band photoelectron energy distribution shows both 4f5 and 4f6 structure. By constant initial state photoelectron yield spectroscopy we have measured separately the 4d → 4f photon absorption of 4f5 and 4f6 surface Sm atoms

Additional details

Publishing Information

Journal Title
J. Phys. (Paris), Colloq.
Journal Issue
no.5
Series
J. Phys. (Paris), Colloq.

Conference

Title
International colloquium on physics of metallic rare earths.
Dates
4 - 7 Sep 1978.
Place
Saint-Pierre-de-Chartreuse, France.

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
11513265
Subject category
S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
BAND THEORY; ELECTRONIC STRUCTURE; EXPERIMENTAL DATA; GRAPHS; PHOTOELECTRON SPECTROSCOPY; SAMARIUM; SURFACES; SYNCHROTRON RADIATION
Descriptors DEC
BREMSSTRAHLUNG; DATA; DATA FORMS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; INFORMATION; METALS; NUMERICAL DATA; RADIATIONS; RARE EARTHS; SPECTROSCOPY