Accumulation of ion beam induced disorder in strontium titanate
Description
Damage accumulation has been investigated in single crystal SrTiO3(1 0 0) irradiated with 1.0 MeV Au2+ by using in situ Rutherford backscattering spectrometry in channeling geometry (RBS/C). Samples were irradiated at temperatures of 170, 300 and 350 K with ion fluences ranging from 0.05 to 0.60 Au2+/nm2. The in situ RBS/C analysis indicates that the relative disorder in both Sr and Ti sublattices shows a strong sigmoidal dependence on ion dose. After an ion fluence of 0.30 Au2+/nm2 at 170 K, the buried region at the damage peak (∼60 nm) becomes fully amorphous, which corresponds to a dose of ∼0.39 dpa. For irradiation at 300 and 350 K, ion fluences of 0.40 Au2+/nm2 (∼0.52 dpa) and 0.45 Au2+/nm2 (∼0.59 dpa) are necessary to achieve an amorphous state at the damage peak, respectively
Additional details
Identifiers
- PII
- S0168583X03007109;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 206
- Journal Issue
- 1-4
- Journal Page Range
- p. 162-165
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international conference on ion beam modification of materials
- Dates
- 1-6 Sep 2002
- Place
- Kobe (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Egypt
- INIS RN
- 35049424
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; CHANNELING; CRYSTAL-PHASE TRANSFORMATIONS; GOLD IONS; ION BEAMS; IRRADIATION; MONOCRYSTALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRONTIUM TITANATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BEAMS; CHARGED PARTICLES; CRYSTALS; IONS; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; SPECTROSCOPY; STRONTIUM COMPOUNDS; TEMPERATURE RANGE; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.