Published December 8, 2003 | Version v1
Journal article

Ge dots self-assembling: Surfactant mediated growth of Ge on SiGe (118) stress-induced kinetic instabilities

  • 1. INFM-Dipartimento di Fisica Universita di Roma TRE Via della Vasca Navale 84, 00146 Rome (Italy)
  • 2. CRMC2-CNRS, Campus Luminy, 13288 Marseille Cedex (France)

Description

The ordering of islands on naturally or artificially nanostructured surfaces is one of the most recent objectives among actual nanotechnology challenges. We show in this letter that, by a combination of two approaches, i.e., a two-step molecular beam epitaxy (MBE) deposition process and surfactant-mediated growth, we are able to obtain chains of nicely ordered ultrasmall islands of lateral size below 50 nm. The two-step MBE process consists of vicinal Si(001) surface self-patterning by SiGe growth instability and Ge dot ordering by subsequent Ge deposition on a SiGe template layer. The surfactant-mediated growth consists of submonolayer Sb deposition prior to Ge growth, in order to reduce the island size up to 25 nm. The best ordering of Ge islands is obtained when the island size matches the wavelength of the template layer

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
83
Journal Issue
23
Journal Page Range
p. 4833-4835
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2003 American Institute of Physics.