Published December 2005
| Version v1
Journal article
Modification of photoionization mass spectrometer with synchrotron radiation as ionization source
Creators
- 1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029 (China)
Description
In this article we introduce a modification on ion optics of a reflectron time-of-flight mass spectrometer for the study of flame chemistry with synchrotron radiation as a continuous ionization source. A small bias voltage is used in the extraction region to simultaneously reduce the background ion signal, eliminate secondary ionization process caused by photoelectrons, increase the ion detection efficiency, and improve the mass resolution
Additional details
Identifiers
- DOI
- 10.1063/1.2149000;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 76
- Journal Issue
- 12
- Journal Page Range
- p. 126108-126108.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37082794
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- CHEMISTRY; EFFICIENCY; ELECTRIC POTENTIAL; EXTRACTION; ION DETECTION; IONS; MASS RESOLUTION; MODIFICATIONS; OPTICS; PHOTOIONIZATION; SYNCHROTRON RADIATION; TIME-OF-FLIGHT MASS SPECTROMETERS
- Descriptors DEC
- BREMSSTRAHLUNG; CHARGED PARTICLE DETECTION; CHARGED PARTICLES; DETECTION; DYNAMIC MASS SPECTROMETERS; ELECTROMAGNETIC RADIATION; IONIZATION; MASS SPECTROMETERS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATIONS; RESOLUTION; SEPARATION PROCESSES; SPECTROMETERS; TIME-OF-FLIGHT SPECTROMETERS
Optional Information
- Notes
- (c) 2005 American Institute of Physics