Published November 2004 | Version v1
Journal article

Extending optical fs metrology to XUV attosecond pulses

  • 1. Max-Planck-Institut für Quantenoptik (Germany)
  • 2. Greece and Univ. of Crete Heraklion (Crete), Foundation for Research and Technology – Hellas, Institute of Electronic Structure & Laser (Greece)

Description

We report on the progress towards a 2nd-order autocorrelation measurement of a coherent superposition of the 7th to the 15th harmonic of the fundamental frequency of the Ti : Sapphire laser. The two-photon ionization of He atoms was investigated and found to be an appropriate non-linear detector. In addition, the technique of volume autocorrelation based on a split mirror wavefront divider was analysed and shown to exhibit adequate degree of modulation. Moreover, the approach presented opens up the path to XUV-pump XUV-probe type of temporal studies of ultrafast processes with a sub-fs temporal resolution.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing (Print)
Journal Volume
79
Journal Issue
7
Journal Page Range
p. 1673-1677
ISSN
0947-8396
CODEN
APAMFC

Optional Information

Copyright
Copyright (c) 2004 Springer-Verlag
Notes
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