Published October 5, 2005
| Version v1
Journal article
Remarks on the electrochemical application of optical methods for the determination of stress in electrodes
Creators
- 1. Department of Physical Chemistry, Eoetvoes Lorand University PO Box 32, Budapest 112, H-1518 (Hungary)
Description
Experimental methods based on light beam deflection for the determination of surface stress change of electrodes are critically revisited. Expressions for the evaluation of data from electrochemical bending beam experiments with non-normal light incidence are derived. Consequences of neglecting the refraction at the optical window or at the air/solution boundary are discussed. It is shown that the data analysis in previous work needs revision, since neglecting the refraction may introduce severe errors in the calculations, and this can lead to inconsistencies in the interpretation of the experimental results
Additional details
Identifiers
- DOI
- 10.1016/j.electacta.2005.04.006;
- PII
- S0013-4686(05)00362-2;
Publishing Information
- Journal Title
- Electrochimica Acta
- Journal Volume
- 51
- Journal Issue
- 1
- Journal Page Range
- p. 93-97
- ISSN
- 0013-4686
- CODEN
- ELCAAV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38016150
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BENDING; DATA ANALYSIS; ELECTRODES; FILMS; STRESSES; VISIBLE RADIATION
- Descriptors DEC
- DEFORMATION; ELECTROMAGNETIC RADIATION; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.