Published January 29, 2010 | Version v1
Journal article

Silicon adatom switching and manipulation on Si(111)- 7 x 7

  • 1. Advanced Nanocharacterization Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
  • 2. Department of Materials Science and Engineering, University of California at Berkeley, Berkeley, CA 94720 (United States)

Description

We report on a multiple-state switching behavior in the tip height or tunneling current of scanning tunneling microscopy on the Si(111)- 7 x 7 surface. This switching is caused by displacement of silicon adatoms under the influence of energetic tunneling electrons. When the tip is fixed over a center adatom, five well-defined levels appear in the measured tip height and tunneling current. These levels are attributed to different electronic structures, depending on the configuration of the center adatoms in the unit cell. We also demonstrate manipulations of the center adatoms by controlling the sample bias.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/21/4/045707

Additional details

Identifiers

DOI
10.1088/0957-4484/21/4/045707;
PII
S0957-4484(10)30154-1;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
21
Journal Issue
4
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43022321
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ELECTRONIC STRUCTURE; ELECTRONS; HEIGHT; NANOSTRUCTURES; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TUNNEL EFFECT; TUNNELING
Descriptors DEC
DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MICROSCOPY; SEMIMETALS