Published January 29, 2010
| Version v1
Journal article
Silicon adatom switching and manipulation on Si(111)- 7 x 7
- 1. Advanced Nanocharacterization Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
- 2. Department of Materials Science and Engineering, University of California at Berkeley, Berkeley, CA 94720 (United States)
Description
We report on a multiple-state switching behavior in the tip height or tunneling current of scanning tunneling microscopy on the Si(111)- 7 x 7 surface. This switching is caused by displacement of silicon adatoms under the influence of energetic tunneling electrons. When the tip is fixed over a center adatom, five well-defined levels appear in the measured tip height and tunneling current. These levels are attributed to different electronic structures, depending on the configuration of the center adatoms in the unit cell. We also demonstrate manipulations of the center adatoms by controlling the sample bias.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/21/4/045707Additional details
Identifiers
- DOI
- 10.1088/0957-4484/21/4/045707;
- PII
- S0957-4484(10)30154-1;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 21
- Journal Issue
- 4
- Journal Page Range
- [6 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43022321
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ELECTRONIC STRUCTURE; ELECTRONS; HEIGHT; NANOSTRUCTURES; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TUNNEL EFFECT; TUNNELING
- Descriptors DEC
- DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MICROSCOPY; SEMIMETALS