Published December 2009
| Version v1
Journal article
Strong quenching of praseodymium f-f luminescence induced by a surface of Y2SiO5:Pr3+ nanocrystal
Creators
- 1. Institute for Scintillation Materials, STC 'Institute for Single Crystals' NASU, 60 Lenin Avenue, 61001 Kharkov (Ukraine)
Description
The direct comparison of the luminescence decay data obtained for nano- and bulk Y2SiO5:Pr3+ crystals has revealed that the concentration threshold of luminescence quenching is strikingly low for nanocrystals. Nanocrystal inhomogeneous stress field induced by a surface stimulates the segregation of the doped Pr3+ ions within the surface layer that provides the relaxation of elastic tension arising due to the difference of the ionic radii of Pr3+ and Y3+. The Pr3+ irregular distribution in the nanocrystal volume results in the Pr3+ local concentration increasing that facilitates the luminescence quenching.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jlumin.2009.01.037Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2009.01.037;
- PII
- S0022-2313(09)00162-8;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 129
- Journal Issue
- 12
- Journal Page Range
- p. 1695-1697
- ISSN
- 0022-2313
- CODEN
- JLUMA8
Conference
- Title
- 15. international conference on luminescence and optical spectroscopy of condensed matter
- Acronym
- ICL'08
- Dates
- 7-11 Jul 2008
- Place
- Lyon (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41114938
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTALS; DOPED MATERIALS; LUMINESCENCE; NANOSTRUCTURES; PRASEODYMIUM IONS; QUENCHING; SEGREGATION; YTTRIUM IONS; YTTRIUM SILICATES
- Descriptors DEC
- CHARGED PARTICLES; EMISSION; IONS; MATERIALS; OXYGEN COMPOUNDS; PHOTON EMISSION; SILICATES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.