Application of a multiregion model to the EM scattering from a rough surface with or without a target above it
Creators
- 1. School of Science, Xidian University, Xi'an 710071 (China)
Description
An efficient multiregion model is introduced to calculate the electromagnetic scattering from a perfectly electrical conducting (PEC) rough surface with or without a PEC target above it. In the multiregion model, the rough surface is split into multiple regions depending on their position along the rough surface. Two intermediate regions are chosen as the dominant region. If a target is located above the rough surface, the target will also be included in the dominant region. The method of moments (MOM) is only adopted on the dominant region to ensure validity. Hence, the new model can greatly reduce the number of unknowns associated with full MOM analysis. The induced electric currents on the other regions are obtained by approximately considering the mutual coupling between different regions along the rough surface. Compared with the published hybrid method, this new model is not only suitable for EM scattering from a target above a rough surface but also applicable for just rough surfaces. Several numerical simulations are presented to show the validity and efficiency of the multiregion model. (general)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/20/5/050201Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 20
- Journal Issue
- 5
- Journal Page Range
- [11 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45012853
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- APPROXIMATIONS; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; COUPLING; EFFICIENCY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; MATHEMATICAL MODELS; SCATTERING; SURFACES
- Descriptors DEC
- CALCULATION METHODS; CURRENTS; ELECTRICAL PROPERTIES; EVALUATION; PHYSICAL PROPERTIES; SIMULATION