Published June 1972 | Version v1
Journal article

Groove detectors from high-purity germanium

Creators

Description

Detector have been fabricated from pure germanium with a lithium diffused N+ contact, and a P+ contact which is ion implanted in a dc glow discharge in boron trifluoride. A deep groove is used to increase the breakdown voltage. Measurements of the current-voltage characteristics of these detectors after temperature cycling are reported. The correlation of smooth etch pits with severe trapping in pure germanium detectors is shown. Finally, the performance of a few large detectors is given.

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
19
Journal Issue
3
Series
IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci.
Journal Page Range
275-280
ISSN
0018-9499

Conference

Title
13. scintillation and semiconductor counter symposium.
Dates
1 Mar 1972.
Place
Washington, DC.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4061488
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FABRICATION; LI-DRIFTED GE DETECTORS; PERFORMANCE
Descriptors DEC
GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
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