Published 1995 | Version v1
Miscellaneous

Surface roughness by X-ray and neutron scattering methods

Creators

  • 1. Experimental Facilities Division, Argonne National Laboratory, Argonne (United States)

Description

no abstract available

Part of:
Abstracts of 2. International School and Symposium on Physics in Materials Science

Additional details

Publishing Information

Imprint Title
Abstracts of 2. International School and Symposium on Physics in Materials Science
Imprint Pagination
[132 p.].
Journal Page Range
p. L15.

Conference

Title
2. International School and Symposium on Physics in Materials Science.
Dates
17-23 Sep 1995.
Place
Jaszowiec (Poland).

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
29033556
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract, Non-conventional Literature
Descriptors DEI
INTERFACES; MEETINGS; NEUTRON DIFFRACTION; ROUGHNESS; SURFACE PROPERTIES; SYNCHROTRON RADIATION; X-RAY DIFFRACTION
Descriptors DEC
BREMSSTRAHLUNG; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; RADIATIONS; SCATTERING

Optional Information