Published May 2015 | Version v1
Journal article

SET Detection and Compensation and Its Application in PLL Design

  • 1. Department of Electrical Engineering, Southern Methodist University, Dallas, TX 75275 (United States)
  • 2. Department of Electrical and Computer Engineering, University of Houston, Houston, TX 77004 (United States)
  • 3. Department of Physics, Southern Methodist University, Dallas, TX 75275 (United States)

Description

This paper presents a new charge compensation (CC) scheme to mitigate single event transient (SET) effect at the output node of the charge pump (CP), the most SET vulnerable node in a Phase-Locked Loop (PLL). It achieves a 4X less SET-induced voltage disturbance at the ring oscillator control node as well as a faster PLL recovery time. During the normal operation, the CC circuit does not affect the PLL dynamics. Its control block ensures that the CC circuit is enabled only when the CP output voltage is disturbed by SET strikes. This avoids the conflict between SET charge compensation and normal PLL phase correction. The PLL covers a 12.5 MHz to 500 MHz tuning range with a root-mean-square (RMS) jitter of 4.9 ps. It consumes 21.5 mW of power under a 1.5 V power supply. The CC circuit consumes 4.5 mW power and occupies 5.3% of the PLL area

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/10/05/C05018

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
10
Journal Issue
05
Journal Page Range
p. C05018
ISSN
1748-0221

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47068510
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CONTROL; DESIGN; DETECTION; ELECTRIC POTENTIAL; MHZ RANGE; OSCILLATORS; RINGS; STEADY-STATE CONDITIONS; TUNING
Descriptors DEC
ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE