Published 1983
| Version v1
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Normalized emittance of SITEX negative ion source
Description
An emittance measurement employing two techniques are being made on SITEX. To this end, a 2-D calculation was performed to design the accelerator in order to reduce electric field abberations. The calculated normalized emittance is 6 x 10-4 IIcm mrad for an angular divergence theta/sub RMS/ approx. = 0.280. Status of the experimental findings are presented and a comparison made to the calculated value which will yield the ion sputter energy
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE84003285.Files
15025300.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 9 p.
- Report number
- CONF-831180--4
Conference
- Title
- 3. international symposium on the production and neutralization of negative ions and beams.
- Dates
- 14-18 Nov 1983.
- Place
- Upton, NY (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 15025300
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM EMITTANCE; BEAM OPTICS; DEUTERIUM IONS; HYDROGEN IONS 1 MINUS; ION SOURCES; KEV RANGE 10-100; MEASURING METHODS; MILLI AMP BEAM CURRENTS; PERFORMANCE; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ANIONS; BEAM CURRENTS; CHARGED PARTICLES; CURRENTS; ENERGY RANGE; HYDROGEN IONS; IONS; KEV RANGE