Published October 1987
| Version v1
Journal article
Calculating γ radiation absorbed dose in oxide dielectric materials
Description
The methods are developed and calculations of gamma radiation absorbed doses in SiO2, Al2O3, BeO oxide dielectric materials are carried out. The calculations are also performed for comparison for the model dosimetric patterns H2O and cyclohexane. The results of calculations are compared with the values of the absorbed dose rates obtained experimentally by a chemical way. It is established that the Compton electrons make the main contribution into the process of energy transfer
Additional details
Additional titles
- Original title (Russian)
- Расчет поглощенной дозы γ-излущения в оксидных диэлектриках
Publishing Information
- Journal Title
- At. Ehnerg.
- Journal Volume
- 63
- Journal Issue
- 4
- Series
- At. Ehnerg.
- Journal Page Range
- 269-270
- ISSN
- 0004-7163
- CODEN
- AENGA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 19065478
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM OXIDES; BERYLLIUM OXIDES; COMPTON EFFECT; CYCLOHEXANE; DOSE RATES; GAMMA RADIATION; PHOTOELECTRIC EFFECT; RADIATION DOSES; SILICON OXIDES; THEORETICAL DATA; WATER
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALKANES; ALUMINIUM COMPOUNDS; BASIC INTERACTIONS; BERYLLIUM COMPOUNDS; CHALCOGENIDES; CYCLOALKANES; DATA; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; HYDROCARBONS; HYDROGEN COMPOUNDS; INFORMATION; INTERACTIONS; IONIZING RADIATIONS; NUMERICAL DATA; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; POLAR SOLVENTS; RADIATIONS; SCATTERING; SILICON COMPOUNDS; SOLVENTS