Electron backscatter diffraction: Strategies for reliable data acquisition and processing
Creators
- 1. Materials Research Centre, School of Engineering, Swansea University, Swansea SA2 8PP (United Kingdom)
Description
In electron backscatter diffraction (EBSD) software packages there are many user choices both in data acquisition and in data processing and display. In order to extract maximum scientific value from an inquiry, it is helpful to have some guidelines for best practice in conducting an EBSD investigation. The purpose of this article therefore is to address selected topics of EBSD practice, in a tutorial manner. The topics covered are a brief summary on the principles of EBSD, specimen preparation, calibration of an EBSD system, experiment design, speed of data acquisition, data clean-up, microstructure characterisation (including grain size) and grain boundary characterisation. This list is not meant to cover exhaustively all areas where EBSD is used, but rather to provide a resource consisting of some useful strategies for novice EBSD users.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchar.2009.05.011Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2009.05.011;
- PII
- S1044-5803(09)00187-9;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 60
- Journal Issue
- 9
- Journal Page Range
- p. 913-922
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44025432
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; CALIBRATION; DATA ACQUISITION; DATA PROCESSING; E CODES; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN ORIENTATION; GRAIN SIZE; TEXTURE
- Descriptors DEC
- COHERENT SCATTERING; COMPUTER CODES; DIFFRACTION; MICROSTRUCTURE; ORIENTATION; PROCESSING; SCATTERING; SIZE
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.