Published March 2006 | Version v1
Journal article

Chiral silicon nanostructures

  • 1. Leibniz-Institut fuer Oberflaechenmodifizierung (IOM), Permoserstrasse 15, D-04318 Leipzig (Germany)
  • 2. Universitaet Leipzig, Fakultaet fuer Chemie und Mineralogie, Institut fuer Kristallographie, Mineralogie und Materialwissenschaft (Germany)

Description

Glancing angle ion beam assisted deposition is used for the growth of amorphous silicon nanospirals onto [0 0 1] silicon substrates in a temperature range from room temperature to 475 deg. C. The nanostructures are post-growth annealed in an argon atmosphere at various temperatures ranging from 400 deg. C to 800 deg. C. Recrystallization of silicon within the persisting nanospiral configuration is demonstrated for annealing temperatures above 800 deg. C. Transmission electron microscopy and Raman spectroscopy are used to characterize the silicon samples prior and after temperature treatment

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.11.011;
PII
S0168-583X(05)01908-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
244
Journal Issue
1
Journal Page Range
p. 40-44
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
Indo-German workshop on synthesis and modifications of nano-structured materials by energetic ion beams
Dates
20-24 Feb 2005
Place
New Delhi (India)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37069641
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; ARGON; DEPOSITION; ION BEAMS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; RECRYSTALLIZATION; SILICON; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; GASES; HEAT TREATMENTS; LASER SPECTROSCOPY; MICROSCOPY; NONMETALS; RARE GASES; SEMIMETALS; SPECTROSCOPY; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.