Published March 2006
| Version v1
Journal article
Chiral silicon nanostructures
- 1. Leibniz-Institut fuer Oberflaechenmodifizierung (IOM), Permoserstrasse 15, D-04318 Leipzig (Germany)
- 2. Universitaet Leipzig, Fakultaet fuer Chemie und Mineralogie, Institut fuer Kristallographie, Mineralogie und Materialwissenschaft (Germany)
Description
Glancing angle ion beam assisted deposition is used for the growth of amorphous silicon nanospirals onto [0 0 1] silicon substrates in a temperature range from room temperature to 475 deg. C. The nanostructures are post-growth annealed in an argon atmosphere at various temperatures ranging from 400 deg. C to 800 deg. C. Recrystallization of silicon within the persisting nanospiral configuration is demonstrated for annealing temperatures above 800 deg. C. Transmission electron microscopy and Raman spectroscopy are used to characterize the silicon samples prior and after temperature treatment
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.11.011;
- PII
- S0168-583X(05)01908-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 244
- Journal Issue
- 1
- Journal Page Range
- p. 40-44
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- Indo-German workshop on synthesis and modifications of nano-structured materials by energetic ion beams
- Dates
- 20-24 Feb 2005
- Place
- New Delhi (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069641
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ARGON; DEPOSITION; ION BEAMS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; RECRYSTALLIZATION; SILICON; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; GASES; HEAT TREATMENTS; LASER SPECTROSCOPY; MICROSCOPY; NONMETALS; RARE GASES; SEMIMETALS; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.