Published December 28, 2006
| Version v1
Journal article
Fitting a free-form scattering length density profile to reflectivity data using temperature-proportional quenching
Creators
- 1. Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616 (United States)
Description
A technique for fitting a free-form scattering length density profile to reflectivity data via least-squares minimization is presented. The approach combines aspects of simulated annealing with a parametrized representation of the scattering length density profile. The ability of the algorithm to accurately recover the scattering length density profile from arbitrary initial parameter values is demonstrated for simulated and experimental data
Additional details
Identifiers
- DOI
- 10.1063/1.2403126;
Publishing Information
- Journal Title
- Journal of Chemical Physics
- Journal Volume
- 125
- Journal Issue
- 24
- Journal Page Range
- p. 244702-244702.8
- ISSN
- 0021-9606
- CODEN
- JCPSA6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38032934
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALGORITHMS; ANNEALING; APPROXIMATIONS; CRYSTALLOGRAPHY; LEAST SQUARE FIT; NEUTRON DIFFRACTION; QUENCHING; REFLECTIVITY; SCATTERING LENGTHS; X-RAY DIFFRACTION
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; HEAT TREATMENTS; LENGTH; MATHEMATICAL LOGIC; MATHEMATICAL SOLUTIONS; MAXIMUM-LIKELIHOOD FIT; NUMERICAL SOLUTION; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE PROPERTIES
Optional Information
- Notes
- (c) 2006 American Institute of Physics